高性能DC测试-NI PXI源测量单元及其应用_NI.pdf

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1、高性能DC测试:NI PXI源测量单元及其应用莫映亮系统工程部高级经理NI中国创新发展中心DC Measurement Challenges Various Applications Require High-Performance DC Measurement Materials ResearchMeasurement Wafer-Level Parametric MeasurementSemiconductor Production TestModule/PCBA Production Test Key DC Measurement Challenges Accurate measurem

2、ent at ultra-low signal levels Fast pulsing measurement Fast sampling speeds to reveal transient characteristics Synchronization of various types of resources High channel density for parallel measurement High reliability for production test High measurement speed for production test Low-cost for pr

3、oduction testDC VOLTAGE SOURCEDC CURRENT SOURCEPROGRAMMABLE LOADVOLTMETERISOLATED DIGITIZERWAVEFORM GENERATORAMMETEROHMMETERVAPULSE GENERATOR+NI PXI SMUs Target to Meet the Key RequirementsFunctionality of NI Source Measure UnitsNI High Performance PXI SMU ProductsNI PXI SMU BenefitsHigh Channel Den

4、sityNI SMUs allow you to fit more channels in a smaller space to reduce system footprintExcellent Software SupportNI SMU support a breadth of programming languages with easy-to-use interactive pannel and examples NI SMUs are designed to leverage some features for fast operation to help you reduce te

5、st timeHigh Measurement SpeedBroad Range of OptionsNI offers a variety of SMUs in the PXI form factor which serve a wide range of test and characterization needsLong History to Offer PXI SMUs with Good Reputation2008200920102011201220132014 2015 20162017 2018 201920202021 2022 2023 PXIe-4142/3/4/54-

6、ch General Purpose,STSPXIe-41351-ch Low-Current,WLR,WATPXIe-4162/3High-Density for STS,OptosPXIe-41474-ch General Purpose,STS,RFFEPXIe-41901-ch LCR Meter&SMU for General PurposePXIe-4138/91-ch General Purpose,STS,OptosPXIe-4140/14-ch General Purpose,STSPXI-4130/21-ch General Purpose SMUPXIe-4136/71-