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DCON26_SLIDES_Track11_Tutorial朇haracterizingDebuggingtheTopThreeEMCIssuesRadiatedEmissionsRadiatedImmunity_134_131.pdf

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1、Welcome to ConferenceFebruary 2426,2026Santa Clara Convention CenterExpoFebruary 2526,20261Benchtop Troubleshooting,Radiated Immunity,ESD and EFTKenneth Wyatt,(Wyatt Technical Services LLC)2Information Classification:GeneralImageSPEAKERKenneth WyattPrincipal Consultant,Wyatt Technical Services LLCPl

2、ease contact through the web site:https:/www.BenchtopEMC.comKenneth Wyatt is principal consultant of Wyatt Technical Services LLC and served three years as the senior technical editor for Interference Technology Magazine from 2016 through 2018.He has worked in the field of EMC engineering for over 3

3、0 years with a specialty in EMI troubleshooting and pre-compliance testing.He is a co-author of the popular EMC Pocket Guide(2nd edition)and RFI Radio Frequency Interference Pocket Guide.He also co-authored the book with Patrick Andr,EMI Troubleshooting Cookbook for Product Designers,with forward by

4、 Henry Ott.He recently completed a three-volume“EMC Troubleshooting Trilogy”,which is available through Amazon.He is widely published and authors a monthly column,“EMC Bench Notes”,for InCompliance Magazine and EE World.Ken is a senior life member of the IEEE and member of the EMC Society.To contact

5、 Ken or for more information on technical articles,training schedules and links,check out his web site:https:/BenchtopEMC.com.3Information Classification:GeneralTodays top three immunity issuesRadiated emissions(RE)Radiated immunity(RI)Electrostatic discharge(ESD)Electrically Fast Transient(EFT)Viol

6、ation of best engineering practices for EMCLower IC supply voltages:5 3.3 1.8 etc.More low cost mobile devicesProliferation of wireless and high power transmittersOn-board energy sourcesLets tackle radiated immunity and ESD today!*Ill also include a bit on EFTInformation Classification:GeneralSource

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1. **会议与专家**:2026年2月24-26日圣克拉拉会议中心,Kenneth Wyatt(30年EMC经验)主讲辐射抗扰度(RI)、ESD及EFT故障排查。 2. **核心问题**:当前三大免疫问题为辐射发射(RE)、辐射抗扰度(RI)、ESD,主因包括低压IC、无线设备增多及设计缺陷。 3. **测试方法**: - **RI测试**:使用Dremel工具(1-500MHz)、继电器(10MHz-1.5GHz)或低成本RF合成器(如Windfreak SynthNV,$649)生成局部场,TEM cell仅需+20dBm即可达3-10V/m。 - **ESD测试**:硬币袋法(30-500ps上升沿)或KeyTek MiniZap(15kV),通过电流探头追踪路径。 - **EFT测试**:Langer EMV Mini Burst生成2ns脉冲,模拟开关瞬态。 4. **案例**:血分析仪电机故障因RF干扰速度传感器,加磁环解决;轮胎厂机器人ESD损坏电池管理FET,需优化屏蔽与接地。
**如何快速定位ESD故障?** **低成本RI测试方案有哪些?** **EFT干扰如何有效防护?**
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