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DCON26_SLIDES_Track04_AnImprovedBroadbandMaterialCharacterizationMethod_49_101.pdf

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1、Welcome to ConferenceFebruary 2426,2026Santa Clara Convention CenterExpoFebruary 2526,2026 1An improved broadband material characterization methodFeng-Nan(Leon),Wu,(Samtec)Xingling(Mick),Zhou,(Samtec)Feng-Nan(Leon),Wu,(Samtec),Xingling(Mick),Zhou,(Samtec)Tony,Chen,(Samtec)2ImageSPEAKERSFeng-Nan(Leon

2、),WuSignal Integrity(SI)R&D Engineer,SamtecL|https:/ Wu has 21 years of industry experience as an SI engineer having worked at FCI,Flextronics and Samtec.He received his Ph.D.from the National Taipei University of Technology in 2013.Leon works in the SI lab at Samtec Taipei and Dongguan facility whi

3、ch focus on connector measurements.He also performs full wave simulations which support research efforts.He has 6 patents related to connector/footprint design.3 Background/Introduction Challenges of traditional NRW/NIST techniqueso Methodo Practical issues Propagation Constanto Dependencies Conduct

4、ivity and plating Geometric Proposed correction methodo Correct method(Remove dependencies)How does it work?o Time-Domain Gatingo in NRWo in the Improved MethodObjective4 Accurate extraction of dielectric properties(Dk,Df)o Asymmetric airline,Time domain gating requirement o DOE design on dielectric

5、 Experimental validationo Sanity check in time and frequency domainso Correlation with the results from Swissto12 MCK 112Gbps,224Gbps,heavily relied on simulation and correlation.inaccurate Input may cause design fails.(data sheets,experience,products-correlations.)Correlate all parameters(size,manu

6、facturing tolerance,process,material,etc.)in one design are mostly impossible.Simplify the correlation-method to separate the parameters.Background5 Measurement techniques:T/R line(coax and waveguide)NRW/NIST Open-ended coaxial probe Free space Resonant MethodMaterial Characterization6Challenges of

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1. **改进方法背景**:传统NRW/NIST技术存在参考面对齐难、材料长度依赖、制造公差敏感等问题,影响介电常数(Dk)和损耗因数(Df)提取准确性。 2. **核心创新**:提出基于传播常数修正的方法,通过额外测量消除导体属性和几何尺寸(如a、b半径)对Dk/Df的影响,使其独立于材料长度(Dk ∝ 1/L问题解决)。 3. **实验验证**:使用3D打印HT200样本和Swissto12波导套件对比,新方法在40GHz内误差<2%(传统NRW达20%),并通过Djordjevic-Sarkar模型扩展至110GHz。 4. **工程优化**:针对测试夹具不对称问题,采用分段式介质设计+倒角,结合阻抗修正去嵌入(AFR/IEEE P370),将制造公差影响降至最低(阻抗偏差~0.6Ω)。
**材料测量新法?** **NRW技术痛点?** **高频材料如何验证?**
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