DCON26_PAPER_Track12_ManualMicro-probesforOne-PortPCBCharacterizationwithaSingleTouchdown_234_72.pdf

1、 Information Classification:General Manual Micro-Probes for One-Port PCB Characterization with a Single Touchdown Aditya Rao,University of Colorado,Boulder adra3768colorado.edu Eric Bogatin,University of Colorado,Boulder Melinda Piket-May,University of Colorado,Boulder Information Classification:Gen

2、eral Abstract This paper introduces a novel in-situ one-port delta-L technique that can extract the effective dielectric constant from measurement-simulation correlation using a single self-aligning SET2DIL microprobe touch-down.When combined with a delta-W structure,this methodology also provides u

3、nique values for the as-fabricated physical dimensions and material properties that can be directly utilized in simulation.Using a differential(SET2DIL)probe for 1-port delta-L measurements reduces complexity and increases efficiency,saving over 75%of the time required for traditional 2-port delta-L

4、 measurements.The paper also expands on sources of anomalous dispersion,such as impedance discontinuities and port impedances,and establishes the need for de-embedding techniques to enable 1-port methodologies.Author(s)Biography Eric Bogatin is a Professor at the University of Colorado,Boulder,in th

5、e High-Speed Digital Engineering Group,a fellow at Teledyne LeCroy,and the Technical Editor of the Signal Integrity Journal.Aditya Rao is a Senior Engineer in the Power and Signal Integrity Group(PSIG)at Qualcomm Technologies.He obtained his PhD.with the High-Speed Digital Engineering Group at the U

6、niversity of Colorado,Boulder.Melinda Piket-May is currently a Professor at the University of Colorado at Boulder in the ECEE Department,in the High-Speed Digital Engineering Group.Information Classification:General Simplifying Material Characterization Techniques Recent improvements in material cha