DCON26_PAPER_Track13_PortReferencinginS-ParametersCriticalInsightsYouNeedtoKnow_213_71.pdf

1、Port Referencing in SParameters Critical Insights You Need toKnowPeter J.Pupalaikis,Ciena CAbstractSparameters are the most common format used for exchanging measurements and simulations in highspeed design.The measurement and simulation of sparameters assumes certain things,notably,how theport is d

2、efined.Most simulators provide sparameters with ports defined as the difference between a signaland reference metal.The implications of this are very important in interpreting these models,their use insimulations,and especially with regard to cascading them.This paper removes this mystery and provid

3、esrigorous mathematical”proofs”and details as to how the engineer must properly deal with sparameterports.BiographyPETER J.PUPALAIKIS was born in Boston,Massachusetts in 1964 and received the B.S.degree in electricalengineering from Rutgers University,New Brunswick,New Jersey in 1988,after serving h

4、onorably in theUnited States Army.He joined LeCroy Corporation(now Teledyne LeCroy),a manufacturer of highperformance measurement equipment located in Chestnut Ridge,New York in 1995 where he worked for 25 years developingtechnology for highspeed oscilloscopes and,as vice president,technology develo

5、pment,managing integrated circuit and digital signal processing development,and intellectual property.In 2020 he left LeCroyto cofound Nubis Communications,a manufacturer of electrooptical transceivers located in New Providence,New Jersey,where he was director of signal integrity.In October 2025,Nub

6、is Communicationswas acquired by Ciena Corporation,and he is now senior director,systems design architecture engineeringat Ciena.His interests include digital signal processing,applied mathematics,signal and power integrity,andradio frequency(RF)/microwave systems.Mr.Pupalaikis holds over 50 patents