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DCON26_PAPER_Track04_EnhancingLossPerformanceLinePrecisioninUHDIPCBsUsingAdvancedPackagingMaterialsIonBeamT_104_186.pdf

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1、 Information Classification:General Enhancing Loss Performance and Line Precision in UHDI PCBs Using Advanced Packaging Materials and Ion Beam Technology Jian Yang,Ruijie Networks Co.,L QianFa liu,Shengyi Technology L Yongming Zhu,Shengyi Technology Junqi Tang,Shengyi Technology T Bin Liao,Beijing N

2、ormal University Pan Pang,Beijing Normal University Scarlet Wang,Shengyi Technology Shihong Lu,Ruijie Networks Co.,L Information Classification:General Abstract This paper addresses the challenges of high signal loss and insufficient line precision in PCBs under ultra high density interconnect(UHDI)

3、processing.We propose a comprehensive technical solution integrating advanced packaging materials with ion beam technology.By employing advanced packaging materials,we enhance the electrical performance and thermal stability of large-sized PCBs.This reduces the dielectric dissipation factor(Df)of bu

4、ildup films and the coefficient of thermal expansion(CTE)during soldering,thereby improving long-term solder joint reliability.Concurrently,ion beam technology enables atomic-scale seed layer deposition on substrate surfaces.Coupled with innovations based on the modified semi-additive process(mSAP),

5、this approach achieves high-precision manufacturing of ultra-small vias and ultra-fine line width/spacing,significantly increasing PCB wiring density.Author(s)Biography Jian Yang is a senior SI Engineer at Ruijie Networks,focuses on signal integrity and power integrity studies.He has 8 years of expe

6、rience in data center switch products development.Qianfa Liu is a Director of the National Engineering Research Center for Electronic Circuit Base Materials,leading corporate-wide technological innovation initiatives.He has 28 years laminate industry experience.Concurrently,he holds positions as Vic

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1. **技术方案**:结合先进封装材料(如SI10NFK LD,Df<0.004@10GHz)与离子束技术,解决UHDI PCB高信号损耗和线宽精度不足问题。 2. **材料优化**:低损耗树脂(Df降低300%)和低CTE(<10 ppm/°C)材料,减少热变形,提升焊点可靠性(寿命比提升50%)。 3. **离子束工艺**:原子级种子层沉积,表面粗糙度降低40%(Rz从1.1μm→0.78μm),结合mSAP工艺实现10/10μm超精细线宽,蚀刻因子达7.9。 4. **性能验证**:448G信号速率下封装损耗降至4.26 dB/inch,热变形显著优于传统PCB,支持145mm×150mm大尺寸BGA制造。
**UHDI PCB如何提升精度?** **离子束技术如何降低损耗?** **高密度PCB如何解决散热?**
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