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DCON26_PAPER_Track04_BreakthroughsinPCBTechnologyforPCIe7.0Interconnects_171_18.pdf

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1、 1 Information Classification:General Breakthroughs in PCB Technology for PCIe 7.0 Interconnects Dan Liu,Alibaba Cloud Computing ld259920alibaba- Yangfan Zhong,Alibaba Cloud Computing yangfan.zyfalibaba- Honghao Cao,Alibaba Cloud Computing honghao.chhalibaba- Mo Liu,Synopsys Jianan Ma,New H3C Wayne

2、Wang,Shennan Circuit Co.,Ltd 2 Information Classification:General Abstract Optimizing the interconnect components electrical performance is essential to enable PCIe 7.0 operation at 128Gbps.Pin field area has been identified as a key bottleneck due to elevated reflections and crosstalk caused by rou

3、ting area congestion and increased PCB board thickness especially in AI and MCP-driven products.Previous PCIe 7.0 study was primarily done on PCB pin field area optimizations through simulations.In this paper,we focus on PCB technology enabling which includes precision registration improvements,adva

4、nced backdrilling techniques,and innovative manufacturing methods.A comprehensive set of measurement data is presented,consisting of signal integrity performance of various PCB configurations with variations in breakout trace width and spacing,Via pad stack geometries,stub lengths,and backdrilling f

5、illing materials.The results successfully demonstrate the feasibility of thinner trace geometries and smaller Via pad stack dimensions and shorter via stubs achieved through advanced PCB manufacturing processes.Physical validation via cross-sectioning and high-resolution microscopy confirmed critica

6、l dimensions within tolerance.The manufacturing precision correlated with measured signal integrity improvements.The breakthroughs of PCB technology mark a significant step forward in PCIe 7.0 interconnect enabling.Author(s)Biography Dan Liu is a staff engineer in Alibaba.Prior to joining Alibaba in

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1. **PCIe 7.0技术瓶颈**:AI和MCP产品中PCB引脚区域因布线拥挤和板厚增加导致反射和串扰严重,需优化互连组件电气性能以支持128Gbps PAM4信号。 2. **PCB技术突破**: - **先进背钻技术**:实现via stub长度3±2mil和1±1mil(传统为5±3mil),空气填充比环氧填充阻抗 discontinuity 更优。 - **高精度对准技术**:优化Mark点设计和AI算法,实现via堆叠几何尺寸6/12/20mil(传统8/14/24mil)。 - **细线蚀刻技术**:突破2/2/2mil走线宽度/间距(传统3/3/3mil)。 3. **验证结果**:30组实验显示,更小via堆叠和走线设计显著降低串扰(FEXT),物理截面显微镜确认关键尺寸公差内。 4. **应用前景**:技术可扩展至PCIe 8.0及更高速率,但需提升量产能力。
**PCIe 7.0瓶颈?** **PCB技术突破?** **信号优化秘诀?**
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