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SESSION 30 Nonvolatile Memory and DRAM.pdf

上传人: 张** 编号:620900 2025-03-31 159页 9.48MB

1、ISSCC 2025SESSION 30 Nonvolatile Memory and DRAM30.1 A 28Gb/mm24XX-Layer 1Tb 3b/cell WF-Bonding 3D-NAND Flash with 5.6Gb/s/pin IOs 2025 IEEE International Solid-State Circuits Conference1 of 24A 28Gb/mm2 4XX-Layer 1Tb 3b/cell WF-Bonding 3D-NAND Flash with 5.6Gb/s/pin IOsSang-Soo Park,Jae-Doeg Lyu,My

2、ungjun Kim,Jaeyun Lee,Younsun Song,Chung-Ho Yu,Hirano Makoto,YongseokKwon,Jong-Hoon Park,Ho-Joon Kim,Daein Lee,Donghyun Seo,Byungrok Go,Seoyoon Jeon,Yoonjee Kim,Doo-Hyun Kim,Youngmin Jo,Hyunjun Yoon,Junehong Park,Inmo Kim,Sunghoon Kim,Hokil Lee,Je-Hyeon Yu,Sang-Lok Kim,Hwan-Seok Ku,Jungmin Seo,Jindo

3、 Byun,Seung-Hyeon Yun,Kyoungtae Kang,Seung-Beom Kim,YohanLee,Yongkyu Lee,Kyunghwa Kang,Han-Jun Lee,Younghwan Ryu,Hyundo Kim,Wontae Kim,Hyeongdo Choi,Juho Jeon,Ansoo Park,Raehyun Song,Jae-Hwan Kim,Jung-Soo Kim,Hwa-Seok Lee,Moo-Kyung Lee,Jae-Ick Son,Jiho Cho,Moosung Kim,Jae-Woo Im,Jongmin Park,Hyuckjo

4、on Kwon,Youngdon Choi,Chiweon Yoon,SeungjaeLee,Kiwhan Song,Sung-Hoi HurSamsung Electronics,Hwaseong,Korea30.1 A 28Gb/mm24XX-Layer 1Tb 3b/cell WF-Bonding 3D-NAND Flash with 5.6Gb/s/pin IOs 2025 IEEE International Solid-State Circuits Conference2 of 24Outline IntroductionNAND ChallengesMerits of BV-NA

5、ND Architecture(IO,Bit-density)Key Features Key Design2-Transistor Coded-GSLStack-Dependent Pass-Voltage ControlExternal Power Assisted Core DrivingProposed SCA protocol with/ODTLow power High speed IO scheme for 5.6-Gb/s/pin(PI-LTT,DFE,RDCA)Conclusion30.1 A 28Gb/mm24XX-Layer 1Tb 3b/cell WF-Bonding

6、3D-NAND Flash with 5.6Gb/s/pin IOs 2025 IEEE International Solid-State Circuits Conference3 of 24Contents IntroductionNAND ChallengesMerits of BV-NAND Architecture(IO,Bit-density)Key Features Key Design2-Transistor Coded-GSLStack-Dependent Pass-Voltage ControlExternal Power Assisted Core DrivingProp

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本文介绍了SK海力士和KIOXIA公司合作开发的一款64Gb DDR4 STT-MRAM存储器。该存储器采用了世界最小的1S1M交叉点单元,单元面积仅为0.001681μm²。为了解决高密度MRAM的读取问题,提出了定时控制放电读取(TCDR)方案和局部电容(LC)模式。TCDR方案通过控制选择器的放电时间来稳定读取信号,LC模式通过减小读取时的电容来提高读取速度和读取裕度。该存储器实现了可靠的读取操作,读取裕度大于4σ,读取速度快,读取信号稳定,为MRAM在存储级内存(SCM)应用和CXL等新市场中的应用提供了潜力。
3D NAND技术如何实现高密度存储? 如何通过技术创新提高GDDR7 DRAM的数据传输速率? MRAM技术在存储领域有哪些应用潜力?
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