DC25_SLIDES_Track12_AccurateAdapterRemovalInHigh_Zhou.pdf

1、Information Classification:GeneralWelcome to ConferenceJanuary 2830,2025Santa Clara Convention Center1ExpoJanuary 2930,2025 Information Classification:GeneralAccurate Adapter Removal in High Precision RF Interconnect CharacterizationSpeaker,Xingling(Mick)Zhou(Samtec)AuthorsXingling Zhou(Samtec),Jaso

2、n Sia(Samtec),Tony Chen(Samtec)O.J Danzy(Keysight)2Information Classification:GeneralImageSPEAKERXingling(Mick)ZhouSI hub manager,S| PhD in electrical engineering from Arizona State University(ASU)in 2001 Authored over 22 journal and conference publications Holds several USA patents Manages an inter

3、connect design hub and global SI labs at Samtec3Information Classification:GeneralOutline4 Introduction Theoretical considerations Samtec AFR Process Simulation study in ADS Practical examples:6 cases Discussions and future workInformation Classification:GeneralIntroduction5Common Tools in SI LabsVe

4、ctor network analyzers for RF,microwave components,and broadband devicesChallenges in TestingImperfect accessories needed to access DUTsHigh-precision RF testing for short and low loss productsTesting 75 components in a 50 systemCalibration and De-embedding TechniquesRemove impact of imperfect cable

5、s,adapters,and fixturesTechniques include SOLT,SOLR,LRM,LRRM,TRLRecent methods like Keysights Automatic Fixture Removal(AFR)Samtecs High-End RF Products.We face challengesSamtec AFR process has be developed in this paperInformation Classification:GeneralTheoretical considerations6 Theoretically,we s

6、hould be able to de-embed fixtures as shown in the equations,as the reverse of cascading.Specific challenges in high-precision testing:discontinuities at the mating interfaces of adapters.The discontinues dont satisfy the assumptions of de-embedding/cascading.DUTFixture 1Fixture 2=1 2=1 211=1222 12=