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DC25_SLIDES_Track02_FastBERAnalysisTechniquefor_Pang.pdf

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1、Information Classification:GeneralWelcome to ConferenceJanuary 2830,2025Santa Clara Convention Center1ExpoJanuary 2930,2025Information Classification:GeneralFast BER Analysis Technique for Next Generation Chiplet Simultaneous Bi-Directional TransceiverSpeaker:Tu Gong,Julin Technology Co.,Ltd.Authors

2、:Tingting Pang,T-Head Semiconductor Co.,Ltd.Yanbin Chen,T-Head Semiconductor Co.,Ltd.Jialong Dong,Julin Technology Co.,Ltd.2Information Classification:GeneralImageSPEAKERTu Gong SI Engineer&Field Application Engineer,Julin Technology Co.,Ltd.tugongjulin-He received his B.S.and M.S.from the Universit

3、y of Sheffield,UK,and NanyangTechnological University,Singapore in 2022,2023 respectively.He began hiscareer at Julin as a Signal Integrity Engineer in 2023.Currently,he works as aField Application Engineer,supporting sales to drive more purchase orders.3Information Classification:GeneralAuthorsTing

4、ting PangSI Engineer,T-Head Semiconductor Co.,Ltd.pangtingting.pttalibaba-SheisworkingonDDR/D2Dmodeling,simulation and validation.Her areas of interestare system-level signal/power integrity and high-speed transceiver design.He graduated from the university of science andtechnology of China,Hefei,Ch

5、ina.He joinedJulin Technology Co.,Ltd.as a signal integrityengineer since 2022,and his interest is system-level SI/PI analysis,simulation and modelingmethodologies.4Yanbin ChenHeisresponsibleforadvancedpackagedesign,DDR/D2Dsystemperformancedevelopment,andsimulation methodology/validation.He received

6、 his B.S.and M.S.from East China Normal University,in 2005,2008 respectively.SI Engineer,T-Head Semiconductor Co.,Ltd.maozhao.cybalibaba-JiaLong DongSI Engineer,Julin Technology Co.,Ltd.jialongdongjulin-Information Classification:GeneralBackground5 Demand for high bandwidth Die-to-Die(D2D)interface

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1. **研究背景**:针对高带宽Die-to-Die(D2D)接口需求,单端同时双向(SBD) signaling可提升每引脚带宽,但需满足超低BER(如UCIe要求<1e-27)。 2. **核心挑战**:SBD信号存在自干扰(SI),源于发射器非对称边沿、接收器非线性及相位差,传统瞬态仿真效率低。 3. **方法创新**:采用双边缘响应(DER)统计眼图仿真,分类建模SI噪声(如相位差均匀分布或训练后固定分布)。 4. **验证结果**:16Gbps设计案例中,DER与SPICE仿真眼高/眼宽误差<3.4%,相位不确定导致眼图严重收缩。 5. **优化建议**:放大倍数需折中,时序失控应<3ps;未来将研究多边缘响应(MER)及自干扰消除均衡器。
**SBD信号挑战?** **自干扰如何建模?** **相位差影响?**
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