DC25_PAPER_Track13_ItTakesAVillage224Gbs_Kocsis.pdf

1、 Information Classification:General It Takes a Village:224Gb/s Mated Test Fixtures for Compliance Sam Kocsis,Amphenol Kevin Mammenga,Wilder Technologies Mike Resso,Keysight Technologies Rick Rabinovich,Keysight Technologies Francesco De Paulis,University of LAquila Information Classification:General

2、 Abstract They say,“it takes a village”,and this session will bring perspectives from the test and measurement experts,fixture and interconnect suppliers,and the academic community to present a comprehensive view on 224 Gb/s mated test fixtures.The group will provide an overview of compliance test f

3、ixtures and offer details for the implementation of Mated Test Fixture(MTF in support of 224 Gb/s.The presentation will demonstrate the impact of the effective wipe on the bandwidth and overall performance of a front-panel pluggable module,while promoting performance requirements for 224 Gb/s per la

4、ne applications.Key aspects of measurement bandwidth and capability will be discussed to lay the foundation for the ability to qualify the channels to the appropriate frequency with sufficient quality.The use of advanced software and S-parameter processing tools will aid vector network analyzers(VNA

5、)in converting the measurements into meaningful datapoints.For over 2 years test fixture and interconnect suppliers have been working on ways to enhance the mechanical connection of the pluggable module and capture consistent results across all the lanes in x4,x8 and x16 lane interfaces.The session

6、will explore the challenges faced when creating the fixtures and managing their interaction with the connector receptacle and cage components.Significant attention will be paid to the“effective wipe”and its impact on the bandwidth and overall measurement quality.With the IEEE P802.3djTM project cont