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DC25_PAPER_TRACK10_BalancingCurrentDensityToHigh_Hostetler.pdf

上传人: S** 编号:1240729 2026-05-16 24页 3.46MB

1、 1 Balancing Current Density to High-Power ASICs in Lateral Power Delivery Designs Brian Hostetler,HPE Inc.2 Abstract Increased power consumption of todays CPUs,GPUs,and ASICs presents new problems for PCB designs that employ traditional lateral power delivery.One problem is the significant I2R loss

2、 in the copper power planes.Another major concern is current imbalance between power vias.This can lead to overheated and failed vias in addition to a risk of electromigration problems in the solder bumps and/or solder balls.This paper describes the technique of using variable via diameters within t

3、he power via field.This alters the conductivity of each individual via and also impacts the leftover webbing in the power planes made by the antipads.The paper analyzes the effectiveness of this approach to a new PCB design,discussing initial simulation results along with measurements of via current

4、 uniformity on the manufactured board with ASIC attached.Author(s)Biography Brian Hostetler is a senior electrical engineer at Hewlett Packard Enterprise,specializing in power integrity.He is responsible for the design of power delivery networks for Cray supercomputer systems.He develops cabinet-lev

5、el and board-level designs,simulations,and measurements.He is also responsible for the design and verification of ultra-low jitter clock solutions for next-generation ASICs.He holds degrees from Indiana State University and Purdue University.3 Motivation Application-specific integrated circuits(ASIC

6、s)have power demands that are increasing faster than their physical size,resulting in a continuous growth of their power density.Current density in the power distribution network is likewise increasing without corresponding improvements in PCB technology.Copper plating thicknesses within via barrels

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1. **问题背景**:高功率ASIC(如CPU/GPU)的电流密度增加,导致PCB电源通孔(via)电流不均,引发过热、失效及电迁移风险。 2. **核心数据**:HPE的ASIC核心轨需求372A(190个VDD球),理想单孔电流1.96A,远超传统1A安全阈值。 3. **解决方案**:采用变径通孔(如中心21.7mil、边缘7.9mil)结合分层连接,使电流分布更均匀(标准差从0.47A降至0.25A)。 4. **验证结果**:实测168.5A负载下,通孔电流与仿真趋势一致,最大电流从3.3A降至2.6A,显著降低过热风险。
**电流失衡怎么办?** **过热如何预防?** **设计有何创新?**
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