DC25_SLIDES_TRACK13_InsertionLossOfMechanicallyRoughened_Steinberger.pdf

1、Information Classification:GeneralWelcome to ConferenceJanuary 2830,2025Santa Clara Convention Center1ExpoJanuary 2930,2025 Information Classification:GeneralInsertion Loss of Mechanically Roughened ConductorsMichael Steinberger,(MathWorks)Orlando Bell,(GigaTest Labs)Michael Tsuk(MathWorks)2Informat

2、ion Classification:GeneralImageImage SPEAKERSMichael SteinbergerConsulting Software Engineer,MathW|Michael has over 30 years of experience designing very high-speed electronic circuits.Dr.Steinberger holds a Ph.D.from the University of Southern California and has been awarded 14 patents.He was Desig

3、nCon 2015s Engineer of the Year.He is currently responsible for the behavioral modeling of mixed analog and digital circuits.Before joining MathWorks,Dr.Steinberger was the lead architect for high-speed serial channel analysis at SiSoft.Orlando BellVP of Engineering,GigaTest L|Orlandos key responsib

4、ilities include managing the high-frequency characterization lab and driving the research and development of advanced test hardware for the Signal Integrity market.He holds a BSEE and MSEE from the University of Florida in Gainesville,Florida.3Information Classification:General Background Test Struc

5、tureoFabrication ProcessoMechanical Structure MeasurementsoLow Frequency DataoHigh Frequency Data Measurement Impairment De-Embedding Conductor Roughness Calculations Conclusions and RecommendationsAgenda:Roughened Conductor Insertion Loss4Information Classification:General5Sources of Transmission L

6、ine LossConductorDielectricRamo,Whinnery and Van Duzer,Fields and Waves in Communications Electronics,Third Edition,Section 6.4 Waves in Imperfect Dielectrics and Conductors,John Wiley&Sons,Inc.,copyright 1994.=+=1+2=1 382+2Skin ResistanceDielectric LossSkin InductancePCB transmission lines typicall