SESSION 17 Hardware Security.pdf

1、ISSCC 2025SESSION 17Hardware Security17.1:Sensor-Less Laser Voltage Probing Attack Detection via Run-Time Leakage Shift Monitoring with 4.35%Area Overhead 2025 IEEE International Solid-State Circuits Conference1 of 37Sensor-Less Laser Voltage Probing Attack Detection via Run-Time Leakage Shift Monit

2、oring with 4.35%Area OverheadHui Zhang*1,Longyang Lin*2,Dingyi Xiong1,Massimo Bruno Alioto1(*equally credited authors)1 National University of Singapore,Singapore2 Southern University of Science and Technology,Shenzhen,China17.1:Sensor-Less Laser Voltage Probing Attack Detection via Run-Time Leakage

3、 Shift Monitoring with 4.35%Area Overhead 2025 IEEE International Solid-State Circuits Conference2 of 37Outline Laser Voltage Probing Attacks(LVP)On-Chip LVP Detection,Sensor vs.Sensor-Less Proposed Sensor-Less Detection Scheme Test Setup,&Post-Silicon Processing for Mounting LVP Evaluation of LVP A

4、ttacks:Thermal,SNR vs Tattack Evaluation of VVDD with Extreme Stdcell Config.Full Demonstration:AES Comparison With Prior Arts Conclusion17.1:Sensor-Less Laser Voltage Probing Attack Detection via Run-Time Leakage Shift Monitoring with 4.35%Area Overhead 2025 IEEE International Solid-State Circuits

5、Conference3 of 37Outline Laser Voltage Probing Attacks(LVP)On-Chip LVP Detection,Sensor vs.Sensor-Less Proposed Sensor-Less Detection Scheme Test Setup,&Post-Silicon Processing for Mounting LVP Evaluation of LVP Attacks:Thermal,SNR vs Tattack Evaluation of VVDD with Extreme Stdcell Config.Full Demon

6、stration:AES Comparison With Prior Arts Conclusion17.1:Sensor-Less Laser Voltage Probing Attack Detection via Run-Time Leakage Shift Monitoring with 4.35%Area Overhead 2025 IEEE International Solid-State Circuits Conference4 of 37Laser Voltage Probing Attacks(LVP)Si aplanatic solid immersion lens(AS